Reconfigurable self-timed regenerators for wide-range voltage scaled interconnect

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Abstract

A reconfigurable self-timed regenerator based global interconnect scheme enables graceful degradation of performance and power in wide range dynamic voltage/frequency scaled systems. A test chip demonstrates up to 40% and 25% better performance scaling than a traditional repeater based interconnect at 1V and 0.5V, respectively, in 45nm SOI CMOS.

Type
Conference paper
Publication
2015 IEEE Asian Solid-State Circuits Conference (A-SSCC)
Date
CMOS integrated circuits Delays DVFS integrated circuit interconnections Integrated circuit interconnections Interconnect Inverters Near Threshold reconfigurable self-timed regenerator based global interconnect scheme Regenerator repeater based interconnect Repeaters silicon-on-insulator size 45 nm SOI CMOS test chip voltage 0.5 V voltage 1 V Voltage measurement wide range dynamic voltage-frequency scaled systems wide-range voltage scaled interconnect Wide-Range Voltage Scaling Wires